Test 2 Syllabus
NOTE:
·
This is closed
book, closed text examination.
·
Calculators are
NOT allowed in the examination.
·
The questions may
be short type and may include problems.
- Integrated Circuits Categories
- Levels of Integration
- Digital Logic Families
- Characteristics of digital logic families
- Nomenclature of ICs
- Delay of real gates
- Implementation Approaches for Digital ICs
- Digital IC Design Flow
- ASICs in Sun Microsystems SPARCstations1
- Hierarchical Design
- Positive and Negative Logic
- Transmission Gates
- Combinational Circuits
- Analysis of Combinational Circuits
- Design Procedure for Combinational Circuits
- Decoders
- Encoders
- Multiplexers and Demultiplexers
- Binary Adders
- Binary Subtraction
- Binary Adder-Subtractor
- Binary Multipliers
- Decimal Arithmetic
- Definition of sequential circuit
- Latches
- Flip-Flops
- Flip-Flop symbols and Terminology
- Sequential circuit analysis
- Sequential circuit design
- Designing with D Flip-Flop
- Designing with JK Flip-Flop