Test 3
Syllabus
CSCE 5730: Digital CMOS VLSI Design
Instructor: Dr. Saraju
P. Mohanty
NOTE: This is closed
book/text examination.
- Capacitance-voltage
characteristic of transistor
- Different
components and types of capacitance
- Velocity
saturation
- Mobility
degradation
- Channel
length modulation
- Body effect
- Subthreshold conduction
- Junction
leakage
- Gate
leakage (tunneling)
- Effect of Operating
temperature on device performance
- Device
geometry variations
- Capacitance
of wire
- Resistance
of wire
- Inductance
of wire
- Elmore
Delay Model
- Delay
Definitions