Test 2
Syllabus
CSCE 5730: Digital CMOS VLSI Design
Instructor: Dr. Saraju P. Mohanty
NOTE:
·
This is closed
book and closed text examination.
- Junction diode structure
- Diode current
- Diode capacitances
- MOS transistor operation
- MOS transistor I-V characteristics
- MOS transistor model for manual analysis
- Source, drain, and equivalent resistance
of MOS transistor
- Different types of capacitances associated
with MOS transistor
- C-V characteristic of MOS transistor
- Velocity saturation
- Mobility degradation
- Channel length modulation
- Body effect
- Subthreshold conduction
- Junction leakage
- Gate oxide tunneling leakage
- Operating temperature effects
- Device geometry effects
- Latch-up effect
- Concept of threshold voltage